Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

Apple is said to be working on its smart glasses, unofficially called the "Apple Glasses," and the company is reportedly testing at least four designs for the new wearable, according to an analyst.

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

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